感謝分享:)

感謝謝大大提供軟體更新訊息~
想請教大大一個笨問題~
之前是用這個~
Memtest86 V3.0
http://www.memtest86.com/
跟大大提供的~
Memtest86+ V1.10
http://www.memtest.org/
兩個軟體長的好像!能告訴一下有什麼不同?
我都搞混了~

請問如果測試知道有錯誤.如何判斷是哪裡出錯嗎.測試出好幾個錯誤
卻不知哪裡出問題.誰能費心說明嗎

網頁不是有寫:
Based on the well-known original memtest86 written by Chris Brady

感謝您的提醒~
我是想問功能有什麼不同~
要比較兩個英文網頁有點累~
能順便告知嗎?非常感謝~
另外大大都是用那個版本~

呵呵 多謝告知.不過我英文程度太差了.但是也知道我的記憶體太濫了.

要去解釋memtest68+的偵測錯誤訊息...應該先知道一下各項測試在做什麼!

Individual Test Descriptions
Memtest86 executes a series of numbered test sections to check for errors. These test sections consist of a combination of test algorithm, data pattern and cache setting. The execution order for these tests were arranged so that errors will be detected as rapidly as possible. Tests 8, 9, 10 and 11 are very long running extended tests and are only executed when extended testing is selected. The extended tests have a low probability of finding errors that were missed by the default tests. A description of each of the test sections follows:

Test 0 [Address test, walking ones, no cache]
Tests all address bits in all memory banks by using a walking ones address pattern.

Test 1 [Moving Inv, ones&zeros, cached]
This test uses the moving inversions algorithm with patterns of only ones and zeros. Cache is enabled even though it interferes to some degree with the test algorithm. With cache enabled this test does not take long and should quickly find all "hard" errors and some more subtle errors. This test is only a quick check.

Test 2 [Address test, own address, no cache]
Each address is written with its own address and then is checked for consistency. In theory previous tests should have caught any memory addressing problems. This test should catch any addressing errors that somehow were not previously detected.

Test 3 [Moving inv, 8 bit pat, cached]
This is the same as test one but uses a 8 bit wide pattern of "walking" ones and zeros. This test will better detect subtle errors in "wide" memory chips. A total of 20 data patterns are used.

Test 4 [Moving inv, 32 bit pat, cached]
This is a variation of the moving inversions algorithm that shifts the data pattern left one bit for each successive address. The starting bit position is shifted left for each pass. To use all possible data patterns 32 passes are required. This test is effective in detecting data sensitive errors in "wide" memory chips.

Test 5 [Block move, 64 moves, cached]
This test stresses memory by using block move (movsl) instructions and is based on Robert Redelmeier's burnBX test. Memory is initialized with shifting patterns that are inverted every 8 bytes. Then 4mb blocks of memory are moved around using the movsl instruction. After the moves are completed the data patterns are checked. Because the data is checked only after the memory moves are completed it is not possible to know where the error occurred. The addresses reported are only for where the bad pattern was found. Since the moves are constrained to a 8mb segment of memory the failing address will always be less than 8mb away from the reported address. Errors from this test are not used to calculate BadRAM patterns.

Test 6 [Modulo 20, ones&zeros, cached]
Using the Modulo-X algorithm should uncover errors that are not detected by moving inversions due to cache and buffering interference with the the algorithm. As with test one only ones and zeros are used for data patterns.

Test 7 [Moving inv, ones&zeros, no cache]
This is the same as test one but without cache. With cache off there will be much less interference with the test algorithm. However, the execution time is much, much longer. This test may find very subtle errors missed by previous tests.

Test 8 [Block move, 512 moves, cached]
This is the first extended test. This is the same as test #5 except that we do more memory moves before checking memory. Errors from this test are not used to calculate BadRAM patterns.

Test 9 [Moving inv, 8 bit pat, no cache]
By using an 8 bit pattern with cache off this test should be effective in detecting all types of errors. However, it takes a very long time to execute and there is a low probability that it will detect errors not found by the previous tests.

Test 10 [Modulo 20, 8 bit, cached]
This is the first test to use the Modulo-X algorithm with a data pattern other than ones and zeros. This combination of algorithm and data pattern should be quite effective. However, it's very long execution time relegates it to the extended test section.

Test 11 [Moving inv, 32 bit pat, no cache]
This test should be the most effective in finding errors that are data pattern sensitive. However, without cache it's execution time is excessively long.

http://www.memtest86.com/#details

以上簡單來說...
都是在當下的設定環境下...
做各種8bit,32bit,特殊格式資料的定址,搬移,存取,複製,校對,等等動作...
正常合理的PC system基本上都不可以出錯...

出錯即代表此RAM無法在此設定狀態正常運作資料!


而在以下連結則提到AMD系統對於test5,test8有些錯誤報告...
http://www.memtest86.com/#report

然而作者仍認為此為AMD系統對RAM的要求更嚴格才是...
並建議不應使用廉價RAM或將RAM超頻過頭來搭配AMD系統...

感謝詳細之解說

另外可以補充一下...只測預設測試Test1-7大約只耗時5min...
非常快...當然建議多跑幾圈...重覆測試基本的設定穩定性!

^__^

下文中亦提及...All tests需耗時甚久...
而測試若有錯誤...並不會不在簡單測試Test1-7中被先偵測出來!
也就是說簡單測試Test1-7...具備一定的除錯特質!...快速檢查時很適用!
而all test1-11則耗時甚久...需要完全測試穩定性時執行!